Title :
95 GHz metamorphic HEMT power amplifiers on GaAs
Author :
Herrick, K.J. ; Lardizabal, S.M. ; Marsh, P.F. ; Whelan, C.S.
Author_Institution :
Raytheon RF Components, Andover, MA, USA
Abstract :
This paper reports on the first 95 GHz metamorphic HEMT power amplifier demonstration including power as a function of temperature. Two power MHEMT materials with 53% and 53%/43% indium channels are investigated showing a slight advantage to the split channel material. At 95 GHz, G/sub max/ values ranging 8.25-10.8 dB are shown for both materials. Single stage 0.15 mm periphery amplifiers using single 4/spl times/37.5 /spl mu/m FETs show >10 dB small signal gain. Two dB compressed power data at 95 GHz yields 15.3 dBm (224 mW/mm) and PAEs up to 22.8%. Increasing temperature up to 80/spl deg/C results in output power and PAE degradation of only 0.43 dB and 2.6 percentage points, respectively. These promising results are on the path to 100-300 mW MHEMT power amplifiers at W-band with improved manufacturability over InP HEMT.
Keywords :
HEMT integrated circuits; III-V semiconductors; field effect MIMIC; gallium arsenide; integrated circuit design; integrated circuit measurement; millimetre wave power amplifiers; 0.15 mm; 10 dB; 100 to 300 mW; 22.8 percent; 37.5 micron; 4 micron; 8.25 to 10.8 dB; 80 degC; 95 GHz; FET amplifiers; GaAs; W-band GaAs MIMIC; indium channel power MHEMT material maximum gain; metamorphic HEMT power amplifiers; mm-wave power amplifiers; output power/PAE degradation temperature effects; single stage periphery amplifier small signal gain; split channel materials; Degradation; FETs; Gain; Gallium arsenide; Indium; Manufacturing; Power amplifiers; Power generation; Temperature; mHEMTs;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1210901