• DocumentCode
    1632904
  • Title

    DC and analog/RF comparisons of Si- and Ge- nanowire schottky barrier transistors

  • Author

    Pu, Jing ; Sun, Lei ; Han, Ru-qi

  • Author_Institution
    Inst. of Microelectron., Peking Univ., Beijing, China
  • fYear
    2010
  • Firstpage
    947
  • Lastpage
    949
  • Abstract
    The DC and analog/RF performance of p-channel Schottky barrier Si and Ge nanowire transistors are simulated and some impact factors are studied. The results suggest that 100meV and 50meV are the most optimized Schottky barrier height for intrinsic gain and cutoff frequency respectively. Thinner nanowires enhance the drivability of silicon devices while impair that of germanium devices. With gate length scaled down, the intrinsic gain degrades, but cutoff frequency and intrinsic delay benefit from smaller capacitances.
  • Keywords
    Schottky barriers; elemental semiconductors; germanium; nanowires; silicon; DC-RF performance; Ge-nanowire Schottky barrier transistor; Schottky barrier height; Si-nanowire Schottky barrier transistor; analog-RF performance; p-channel Schottky barrier; silicon device; Delay; Logic gates; Schottky barriers; Silicon; Transistors; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-5797-7
  • Type

    conf

  • DOI
    10.1109/ICSICT.2010.5667493
  • Filename
    5667493