DocumentCode
1632904
Title
DC and analog/RF comparisons of Si- and Ge- nanowire schottky barrier transistors
Author
Pu, Jing ; Sun, Lei ; Han, Ru-qi
Author_Institution
Inst. of Microelectron., Peking Univ., Beijing, China
fYear
2010
Firstpage
947
Lastpage
949
Abstract
The DC and analog/RF performance of p-channel Schottky barrier Si and Ge nanowire transistors are simulated and some impact factors are studied. The results suggest that 100meV and 50meV are the most optimized Schottky barrier height for intrinsic gain and cutoff frequency respectively. Thinner nanowires enhance the drivability of silicon devices while impair that of germanium devices. With gate length scaled down, the intrinsic gain degrades, but cutoff frequency and intrinsic delay benefit from smaller capacitances.
Keywords
Schottky barriers; elemental semiconductors; germanium; nanowires; silicon; DC-RF performance; Ge-nanowire Schottky barrier transistor; Schottky barrier height; Si-nanowire Schottky barrier transistor; analog-RF performance; p-channel Schottky barrier; silicon device; Delay; Logic gates; Schottky barriers; Silicon; Transistors; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-5797-7
Type
conf
DOI
10.1109/ICSICT.2010.5667493
Filename
5667493
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