DocumentCode :
1633047
Title :
An adjoint dynamic neural network technique for exact sensitivities in nonlinear transient modeling and high-speed interconnect design
Author :
Cao, Y. ; Xu, J.J. ; Devabhaktuni, V.K. ; Ding, R.T. ; Zhang, Q.J.
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
Volume :
1
fYear :
2003
Firstpage :
165
Abstract :
We propose a new adjoint dynamic neural network (ADNN) technique aimed at enhancing computer-aided design (CAD) of high-speed VLSI modules. A novel formulation for exact sensitivities is derived employing the Lagrange functions approach, and by defining an adjoint of a dynamic neural network (DNN), for the first time. The proposed ADNN is a dynamic model that we solve using integration backwards through time. One ADNN solution can be used to efficiently compute exact sensitivities of the corresponding DNN with respect to all its parameters. Using these sensitivities, we developed a training algorithm that facilitates DNN learning of nonlinear transients directly from continuous time-domain waveform data. Resulting accurate and fast DNN models can be straightaway used for carrying out high-speed VLSI CAD in SPICE-like time-domain environment. The technique can also speed-up physics-based nonlinear circuit CAD through faster sensitivity computations. Applications of the proposed ADNN technique in transient modeling and nonlinear design are demonstrated through high-speed interconnect driver examples.
Keywords :
VLSI; circuit CAD; high-speed integrated circuits; integrated circuit design; integrated circuit interconnections; integration; neural nets; nonlinear network synthesis; sensitivity analysis; transient analysis; Lagrange functions; SPICE-like time-domain environment; adjoint dynamic neural network technique; computer-aided design; continuous time-domain waveform data; exact sensitivities; high-speed VLSI CAD; high-speed VLSI modules; high-speed interconnect design; integration; nonlinear design; nonlinear transient modeling; physics-based nonlinear circuit CAD; sensitivity computations; training algorithm; Artificial neural networks; Design automation; Driver circuits; Integrated circuit interconnections; Intelligent networks; Neural networks; Nonlinear circuits; Radio frequency; Time domain analysis; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7695-1
Type :
conf
DOI :
10.1109/MWSYM.2003.1210907
Filename :
1210907
Link To Document :
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