Title :
IC Reliability Problems in Military Electronic Equipment
Author :
Melamed, Ilya ; Samuel, Sergiu
Keywords :
Application specific integrated circuits; Electronic equipment; Electronic switching systems; Integrated circuit testing; Manufacturing; Military equipment; Performance evaluation; Qualifications; Temperature; Thermal stresses;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1989. The Sixteenth Conference of
DOI :
10.1109/EEIS.1989.720134
