Title :
Intellectual recognition of reliability analysis model based on neural network integration
Author :
Li, Li ; Gao, Zhi
Author_Institution :
Tangshan Coll., Tangshan, China
Abstract :
Intellectual recognition method for the reliability distribution models based on neural network integration has been studied. Normal distribution, Weibull distribution and logarithmic normal distribution are tested and analyzed. The simulation test results tell us that the intellectual recognition system has high confidence degree and high recognition rate, and is easy to be implemented in engineering.
Keywords :
Weibull distribution; machinery; mechanical engineering computing; neural nets; reliability; Weibull distribution; intellectual recognition; logarithmic normal distribution; machinery design; machinery reliability analysis; neural network integration; reliability analysis; Analytical models; Bagging; Boosting; Gaussian distribution; Neural networks; Reliability; Training; Neural Network Integration; fault distribution; mechanical product; reliability;
Conference_Titel :
Instrumentation & Measurement, Sensor Network and Automation (IMSNA), 2012 International Symposium on
Conference_Location :
Sanya
Print_ISBN :
978-1-4673-2465-6
DOI :
10.1109/MSNA.2012.6324618
