Phase noise study of quartz crystal resonators versus the radius of curvature

Author

Sthal, F. ; Boy, J.J. ; Mourey, M. ; Marionnet, F.

Author_Institution

Lab. de Chronometrie, Electronique et Piezoelectricite, Ecole Nationale Superieure de Mecanique et des Microtechniques, Besancon, France

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

639

Lastpage

642

Abstract

First measurements of the phase noise versus the radius of curvature of SC-cut resonators are given. Resonators with adherent electrodes are investigated and compared with unelectroded resonators. The phase noise measurements are obtained with a crystal resonator tester specifically designed to assist in the characterization of quartz crystal resonators

Keywords

1/f noise; Q-factor; crystal resonators; frequency-domain analysis; phase noise; SC-cut resonators; SiO₂; adherent electrodes; atmospheric pressure; frequency domain; inherent phase stability; passive circuit; phase fluctuations; phase noise; quartz crystal resonators; quartz under vacuum; radius of curvature; single sideband power spectral density; third overtone; unelectroded resonators; Atmospheric measurements; Bridge circuits; Calibration; Circuit testing; Frequency; Noise measurement; Phase measurement; Phase modulation; Phase noise; Resistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International

Conference_Location

Seattle, WA

ISSN

1075-6787

Print_ISBN

0-7803-7028-7

Type

conf

DOI

10.1109/FREQ.2001.956354

Filename

956354