Title :
SEU fault-injection at system level: Method, tools and preliminary results
Author :
Mansour, Wassim ; Ramos, Pablo ; Ayoubi, Rafic ; Velazco, Raoul
Author_Institution :
TIMA Labs., Univ. of Grenoble-Alpes, Grenoble, France
Abstract :
An approach to study the effects of single event upsets (SEU) by fault injection performed at system-level is presented. It is illustrated by results obtained on two different versions of a matrix multiplication algorithm, one standard and the second with fault tolerance capabilities. The final goal of this work is to validate fault tolerance techniques implemented at software level and provide a feedback about the weakest variables, improving thus their capabilities to tolerate faults.
Keywords :
fault tolerance; integrated circuit manufacture; integrated circuit reliability; matrix multiplication; radiation hardening (electronics); SEU fault injection effect; fault tolerance techniques; matrix multiplication algorithm; single event upsets; software level; system level; Circuit faults; Computers; Decision support systems; Error analysis; Reliability; Software; Terrestrial atmosphere; CPU; Fault-Injection; SEU; Soft Error; System-Level;
Conference_Titel :
Test Workshop - LATW, 2014 15th Latin American
Conference_Location :
Fortaleza
DOI :
10.1109/LATW.2014.6841907
