Title :
3-axis vibration performance of a compact sapphire microwave oscillator
Author :
Stockwell, I. ; McNeilage, C. ; Mossammaparast, M. ; Green, D.M. ; Searls, J.H.
Author_Institution :
Poseidon Sci. Instruments, Fremantle, WA, Australia
fDate :
6/23/1905 12:00:00 AM
Abstract :
The performance of a compact sapphire microwave oscillator under vibration is measured in three orthogonal axes, and net vibration sensitivity is determined as less than 5 × 10-10 per g. This result is compared with the vibration sensitivity of other oscillator technologies reported in the literature, together with other important oscillator characteristics
Keywords :
crystal oscillators; dynamic testing; electric noise measurement; microwave oscillators; phase noise; sapphire; sensitivity analysis; vibrations; 3-axis vibration performance; 6 to 12 GHz; Al2O3; compact sapphire microwave oscillator; measurement technique; oscillator characteristics; oscillator vibration performance; vibration sensitivity; Accelerometers; Actuators; Frequency; Measurement techniques; Microwave measurements; Microwave oscillators; Noise measurement; Phase noise; Testing; Vibration measurement;
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-7028-7
DOI :
10.1109/FREQ.2001.956365
