DocumentCode :
1633425
Title :
Tunable reflectarray unit cell element using BST technology
Author :
Shen, Ya ; Ebadi, Siamak ; Wahid, Parveen ; Gong, Xun
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL, USA
fYear :
2012
Firstpage :
43
Lastpage :
46
Abstract :
A tunable reflectarray unit cell is presented in this paper using Barium Strontium Titanate (BST) technology. A square patch is capacitively loaded with a narrow gap in the middle and a BST thin-film layer is deposited under the patch. The BST layer is etched away everywhere except for the area under the gap for minimum loss. By tuning the DC bias voltage across the gap, the dielectric constant of the BST layer changes, which results in a change in the effective capacitance of the gap. Therefore, the reflection phase of the reflectarray unit cell can be continuously controlled. Simulation and measurement results are presented at 12.3 GHz. Due to the monolithic integration of the tuning mechanism with the unit cell, this configuration can be applied at millimeter-wave frequencies without suffering from packaging and bonding problems.
Keywords :
microstrip antenna arrays; microwave antenna arrays; millimetre wave antenna arrays; permittivity; reflectarray antennas; thin films; tuning; BST thin-film layer; DC bias voltage tuning mechanism; barium strontium titanate technology; bonding problem; dielectric constant; frequency 12.3 GHz; millimeter-wave frequency; monolithic integration; narrow gap; packaging problem; reflection phase; tunable reflectarray unit cell element; Capacitance; Dielectric constant; Reflection; Reflector antennas; Resonant frequency; Tuning; BST; microstrip patch; reflectarray antenna; unit cell; waveguide simulator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio and Wireless Symposium (RWS), 2012 IEEE
Conference_Location :
Santa Clara, CA
ISSN :
2164-2958
Print_ISBN :
978-1-4577-1153-4
Type :
conf
DOI :
10.1109/RWS.2012.6175302
Filename :
6175302
Link To Document :
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