Title :
A 256Kb ECL RAM with Redundancy
Author :
Fukushi, I. ; Okajima, Y. ; Maki, Y. ; Ishii, Y. ; Nomura, O. ; Toyoda, K. ; Tamauchi, T. ; Fukuma, H.
Author_Institution :
Fujitsu Bipolar IC Division, Kawasaki, Japan
Keywords :
BiCMOS integrated circuits; Bipolar integrated circuits; Flip-flops; MOS devices; PROM; Power dissipation; Read-write memory; Switches; Switching circuits; Switching converters;
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1988.663667
