DocumentCode :
1633521
Title :
Heterojunction PIN diode switch
Author :
Hoag, D. ; Brogle, J. ; Boles, T. ; Curcio, D. ; Russell, D.
Author_Institution :
Microwave Solutions Bus. Unit, M/A-COM Inc., Burlington, MA, USA
Volume :
1
fYear :
2003
Firstpage :
255
Abstract :
This paper describes the development of a heterojunction AlGaAs/GaAs PIN diode as a replacement for the homojunction GaAs PIN diodes commonly used in microwave systems as a control element for commercial and military switch applications up through millimeter wave frequencies. In particular, a single heterojunction PIN diode, when simulated at a bias of 10 mA in a 50 ohm series configuration, indicates a potential reduction in insertion loss of 37% (Rs) with no degradation in isolation (Cj). This paper describes a switch topology of choice which uses a series-shunt element at the main junction, since it offers the widest bandwidth due to the low zero bias capacitance of the series diode. This simple structure has an upper frequency limitation that is dependent on the electrical distance due to the physical location of the series diode relative to the center of the actual device junction and the maximum isolation achievable by the Cj of a discrete diode. PIN switch circuits and RF probable test structures were processed through our GaAs wafer fab and later tested on-wafer for broadband RF performance from 50 MHz through 40 GHz. A comparison between simulated and empirical results for insertion loss, return loss and isolation demonstrates excellent agreement for isolation and a 10% offset for insertion loss and return loss.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; millimetre wave diodes; p-i-n diodes; semiconductor device measurement; semiconductor device models; semiconductor switches; 10 mA; 50 MHz to 40 GHz; 50 ohm; AlGaAs-GaAs; circuit broadband RF performance; discrete diode maximum achievable isolation; heterojunction AlGaAs/GaAs PIN diodes; heterojunction PIN diode switches; homojunction GaAs PIN diodes; insertion loss reduction; isolation degradation; main junction series-shunt element switch topology; microwave/mm-wave switch system control elements; return loss; series configuration diode bias current; series diode low zero bias capacitance/bandwidth; structure upper frequency limitations; Circuit testing; Control systems; Degradation; Diodes; Gallium arsenide; Heterojunctions; Insertion loss; Radio frequency; Switches; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7695-1
Type :
conf
DOI :
10.1109/MWSYM.2003.1210928
Filename :
1210928
Link To Document :
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