DocumentCode :
1633954
Title :
A novel capacitive barometric pressure sensor based on the standard CMOS process
Author :
Nie, Meng ; Huang, Qing-An ; Yu, Hui-Yang ; Qin, Ming ; Li, Wei-Hua
Author_Institution :
Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
fYear :
2010
Firstpage :
1480
Lastpage :
1482
Abstract :
A design of barometric pressure sensor is presented in this paper, which is compatible with the standard CMOS process, and can solve the problem of the electrode feed-through out of the sealed cavity at the same time. Both electrodes of the sensor are leaded from the top side of the chip. When the initial gap of both electrodes formed the capacitor is 0.5 μm, and the side length of the square membrane is 710 μm, the sensitivity of 9.4 fF/hPa can be obtained. The nonlinearity of the device is less than 1.02% over a dynamic range 300-500 hPa. It is shown that the device is suitable to be used in measuring the low pressure varying from 300 to 500 hPa, and is more sensitive when the initial gap of the capacitor is smaller.
Keywords :
CMOS integrated circuits; atmospheric pressure; capacitive sensors; electrodes; pressure sensors; capacitive barometric pressure sensor; electrode feed-through out; sealed cavity; square membrane; standard CMOS process; Biomembranes; CMOS integrated circuits; CMOS process; Capacitance; Capacitors; Electrodes; Sensitivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
Type :
conf
DOI :
10.1109/ICSICT.2010.5667537
Filename :
5667537
Link To Document :
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