DocumentCode
1634160
Title
FANTM: the first article NIF test module for the laser power conditioning system
Author
Smith, David L. ; Wilson, J. Michael ; Harjes, Henry C. ; Moore, William B S ; Hammon, Jud
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
Volume
2
fYear
1999
Firstpage
921
Abstract
Designing and developing the 1.7 to 2.1-MJ power conditioning system (PCS) that powers the flashlamps for the National Ignition Facility (NIF), currently being constructed at Lawrence Livermore National Labs (LLNL), is one of several responsibilities assumed by Sandia National Labs (SNL) in support of the NIF Project. The test facility that has evolved over the last three years to satisfy the project requirements is called FANTM. It was built at SNL and has operated for about 17,000 shots to demonstrate component performance expectations over the lifetime of NIF. The final full NIF system will require 192 PCSs (48 in each of four bays). This paper briefly summarizes the final design of the FANTM facility and compares its performance with the predictions of circuit simulations for both normal operation and fault-mode response. A physics-based, semi-empirical amplifier gain code indicates that the 20 capacitor PCS can satisfy the NIF requirement for an average gain coefficient of 5.00 %/cm and can exceed 5.20 %/cm with 24 capacitors.
Keywords
capacitor switching; flash lamps; laser accessories; load (electric); pulse generators; pulsed power supplies; pulsed power switches; test facilities; 1.7 to 2.1 MJ; FANTM pulsed power supply; NIF test module; National Ignition Facility; average gain coefficient; capacitor banks; circuit simulation; component performance; fault-mode response; laser power conditioning; normal operation; semi-empirical amplifier gain code; Capacitors; Coils; Damping; Laboratories; Personal communication networks; Power conditioning; Power lasers; Pulse amplifiers; Switches; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7803-5498-2
Type
conf
DOI
10.1109/PPC.1999.823666
Filename
823666
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