Title :
Mathematical analysis and simulation for the electrostatic discharge (ESD) according to the EN 61000-4-2
Author :
Fotis, G.P. ; Gonos, I.F. ; Iracleous, D.P. ; Stathopulos, I.A.
Author_Institution :
Electr. Power Dept., Nat. Tech. Univ. of Athens, Greece
Abstract :
The paper is a study for the better understanding of electrostatic discharge (ESD). Electrostatic discharge can change the electrical characteristics of a semiconductor device, degrading or destroying it. Both a mathematical analysis and a simulation process of the ESD generator circuit of the European Standard 61000-4-2 are presented. In the mathematical aspect of the problem, the differential equations for different types of EUT (equipment under test) are solved. A computer simulation of the two types of EUT circuits is shown, using both PSPICE and Matlab programs. A comparison between theoretical results of the mathematical analysis and the two simulation processes is obtained. Finally, conclusions for the ESD phenomenon are presented.
Keywords :
circuit simulation; differential equations; electrostatic discharge; standards; EN 61000-4-2; ESD generator circuit; EUT; circuit analysis; differential equations; electrostatic discharge; equipment under test; mathematical analysis; semiconductor device; Analytical models; Circuit simulation; Circuit testing; Computational modeling; Degradation; Differential equations; Electric variables; Electrostatic discharge; Mathematical analysis; Semiconductor devices;
Conference_Titel :
Universities Power Engineering Conference, 2004. UPEC 2004. 39th International
Conference_Location :
Bristol, UK
Print_ISBN :
1-86043-365-0
