Title :
Efficient generation of test patterns using Boolean difference
Author_Institution :
Dept. of Comput. Sci., Stanford Univ., CA, USA
Abstract :
Most automatic test pattern generation systems for combinational circuits generate a test for a given fault by directly searching a data structure representing the circuit to be tested. The author describes a novel system that divides the problem into two parts: first it constructs a formula expressing the Boolean difference between the unfaulted and faulted circuits. Second, it applies a Boolean satisfiability algorithm to the resulting formula. The novel system can incorporate any of the heuristics used by structural search techniques. It is not only quite general but is able to test or improve untestable every fault in the popular Brglez-Fujiwara test benchmark (Int. Symp. Circuits and Systems, June 1985). Experimental results are presented
Keywords :
Boolean functions; automatic testing; combinatorial circuits; data structures; fault location; logic testing; Boolean difference; Brglez-Fujiwara test benchmark; automatic test pattern generation; automatic testing; combinational circuits; data structure; faulted circuits; heuristics; structural search techniques; Automatic test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Circuits and systems; Combinational circuits; Data structures; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82368
