Title :
Measurement and Modeling of the LTE Train-Ground Channel for High-Speed Railway in Viaduct Scenario
Author :
Ruojun Zhao ; Muqing Wu ; Xiao Xiang ; Jiaqi Yang
Author_Institution :
Lab. of Network Syst. Archit. & Convergence, Beijing Univ. of Posts & Telecommun., Beijing, China
Abstract :
Long Term Evolution (LTE) is commonly deemed to be a promising system for the future High-Speed Railway (HSR). The object of this paper is modeling of the broadband multipleinput multiple-output (MIMO) train-ground channel in LTE system based on the measurements on HSR viaducts. A couple of measurement campaigns are conducted along the Harbin-Dalian passenger dedicated line. The statistical distributions of some critical large and small scale parameters are firstly presented including delay spread, angle spread at transceivers and K factor. Then the channel model is proposed following a geometry-based stochastic modeling approach and the channel transfer matrix is derived to depict the time-varying environment.In particular, the spatial cross-correlation function (CCF) between subchannels,power delay profile (PDP) and the Doppler spectrum are simulated and analyzed to validate the practicality of our model. All these results significantly promote the evaluation and development of the HSR communication system based on LTE.
Keywords :
Long Term Evolution; MIMO communication; bridges (structures); radio transceivers; railway communication; statistical distributions; Doppler spectrum; HSR viaducts; K factor; LTE system; MIMO train-ground channel; angle spread; channel transfer matrix; delay spread; geometry-based stochastic modeling; high-speed railway; long term evolution; multiple-input multiple-output channel; power delay profile; spatial cross-correlation function; statistical distributions; time-varying environment; transceivers; viaduct scenario; Antenna measurements; Channel models; Delays; MIMO; Rail transportation; Receiving antennas; Statistical distributions;
Conference_Titel :
Vehicular Technology Conference (VTC Fall), 2014 IEEE 80th
Conference_Location :
Vancouver, BC
DOI :
10.1109/VTCFall.2014.6966051