• DocumentCode
    1634591
  • Title

    A complete self-defined empirical model for enhancement-mode AlGaAs/InGaAs pHEMTs

  • Author

    Wang, W.K. ; Lin, C.K. ; Wu, C.C. ; Chan, Y.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Chung-li, Taiwan
  • Volume
    1
  • fYear
    2003
  • Firstpage
    443
  • Abstract
    We propose a complete self-defined empirical large-signal and noise including model for enhancement-mode AlGaAs/InGaAs pHEMTs. This model achieves excellent fitting of the DC transconductance, g/sub m/, which considers the difference of the drain-to-source conductance between DC and RF measurements. In addition, for a full prediction at various biases, all parameters of the model are characterized against the gate-to-source and drain-to-source voltages. In consequence, the predictions of the power and IM3 are very accurate. Additionally, it can also predict the NF/sub min/ and /spl Gamma//sub opt/ points well using the noise parameters by calculating the thermal noise of the equivalent circuit model. This noise figure prediction including model is not always available from the commonly used conventional pHEMT models.
  • Keywords
    III-V semiconductors; aluminium compounds; electronic engineering computing; equivalent circuits; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor device models; semiconductor device noise; thermal noise; AlGaAs-InGaAs; DC transconductance; DC/RF measurement drain/source conductance; HEMT complete self-defined empirical models; device noise parameters; enhancement-mode AlGaAs/InGaAs pHEMT; equivalent circuit model thermal noise; gate-to-source/drain-to-source voltages; noise figures; power/IM3 predictions; Circuit noise; Equivalent circuits; Indium gallium arsenide; Noise measurement; Optimized production technology; PHEMTs; Predictive models; Radio frequency; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1210971
  • Filename
    1210971