Title :
ANN model for AlGaN/GaN HEMTs constructed from near-optimal-load large-signal measurements
Author :
Schreurs, D. ; Verspecht, J. ; Vandamme, E. ; Vellas, N. ; Gaquiere, C. ; Germain, M. ; Borghs, G.
Author_Institution :
Div. ESAT-TELEMIC, Katholieke Univ., Leuven, Belgium
Abstract :
AlGaN/GaN HEMTs have a high potential for high-power applications at microwave frequencies. We developed a behavioural model corresponding to the operation condition as how this device will be used in power amplifiers, i.e., at a high output load. The model is based on time-domain large-signal measurements, and the representation format is an artificial neural network (ANN). AlGaN/GaN devices on sapphire are known to be temperature sensitive. Therefore, we also consider the incorporation of the self-heating effect in the behavioural model description.
Keywords :
III-V semiconductors; aluminium compounds; electronic engineering computing; gallium compounds; microwave power amplifiers; neural nets; power HEMT; semiconductor device measurement; semiconductor device models; wide band gap semiconductors; AlGaN-GaN; AlGaN/GaN HEMT ANN models; HEMT near-optimal-load large-signal measurements; artificial neural networks; high output load amplifiers; microwave frequency high-power applications; microwave power amplifiers; sapphire; self-heating effects; temperature sensitive devices; time-domain large-signal measurements; Aluminum gallium nitride; Artificial neural networks; Gallium nitride; HEMTs; High power amplifiers; Load modeling; MODFETs; Microwave frequencies; Operational amplifiers; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1210972