Title :
Evolved fault tolerance in evolvable hardware
Author :
Canham, R.O. ; Tyrrell, A.M.
Author_Institution :
Dept. of Electron., York Univ., UK
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper considers the ability of an evolved circuit to acquire fault tolerance by including fault conditions within the fitness measure of the evolutionary process. A simple oscillator circuit, implemented on a Xilinx FPGA, showed a 12 fold increase in fault-tolerance when compared to a control oscillator using realistic faults
Keywords :
fault tolerance; field programmable gate arrays; Xilinx FPGA; evolved circuit; fault tolerance; oscillator circuit; redundancy; Circuit faults; Circuit testing; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Hardware; Oscillators; Redundancy; Robots; System testing;
Conference_Titel :
Evolutionary Computation, 2002. CEC '02. Proceedings of the 2002 Congress on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-7282-4
DOI :
10.1109/CEC.2002.1004425
