Title :
A high-accuracy temperature sensor with an inaccuracy of ±1 °C From −55°C to 125 °C
Author :
Chen, Jianguang ; Liu, Shaolong ; Cheng, Yuhua
Author_Institution :
Shanghai Res. Inst. of Microelectron., Peking Univ., Beijing, China
Abstract :
A smart temperature sensor based on 0.35um ASMC CMOS process with an inaccuracy of ±1°C from -55°C to 125°C is presented. The sensor uses substrate vertical bipolar transistor to measure the temperature and errors resulting from nonidealities in the readout circuit are reduced to 0.1°C level by applying dynamic element matching (DEM) and chopping offset cancellation techniques. By using pseudo-random sequence, the mismatch of current mirrors can be reduced to smaller comparing with other methods. A voltage proportional to absolute temperature added to base-emitter voltage is used to compensate the process spread at one temperature with the trade off between inaccuracy and complexity. A digital output is realized by an on-chip sigma-delta ADC which is compatible with digital bus interface.
Keywords :
CMOS integrated circuits; choppers (circuits); current mirrors; detector circuits; intelligent sensors; sigma-delta modulation; temperature sensors; ASMC CMOS process; chopping offset cancellation technique; current mirror; digital bus interface; dynamic element matching; high accuracy temperature sensor; on-chip sigma-delta ADC; pseudorandom sequence; size 0.35 mum; smart temperature sensor; Accuracy; CMOS integrated circuits; Calibration; Equations; Temperature measurement; Temperature sensors; Transistors; calibration; dynamic element matching; offset cancellation; pseudo-random sequence; smart sensor; temperature sensor;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
DOI :
10.1109/ICSICT.2010.5667573