Title :
Fading channel characterization for oscillating-beam-pattern smart antennas using geometric-based stochastic channel modeling with circular coverage area
Author :
Zekavat, Seyed ; Nassar, Carl R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
Whenever the channel coherence time is less than the symbol duration, a mobile station (MS) receiver can exploit time diversity to enhance its probability of error performance. One way to ensure a channel coherence time less than the symbol duration is by use of a carefully controlled oscillating-beam antenna array at the base station (BS). Here, beam pattern movement creates small coherence times. In this paper, with an oscillating-beam-pattern antenna array at the BS, the time varying channel is modeled to evaluate the channel coherence time and the available diversity in the MS. Here, a geometric-based stochastic channel model (GSCM) is used, and a circular coverage area is assumed. For a mid-sized city center, coherence times are shown to correspond to 1/7th the symbol duration, suggesting a 7-fold time diversity is available at the MS when the BS´s antenna array pattern is carefully controlled
Keywords :
adaptive antenna arrays; antenna radiation patterns; diversity reception; error statistics; land mobile radio; linear antenna arrays; radiowave propagation; stochastic processes; time-varying channels; antenna array pattern; channel coherence time; circular coverage area; city center; error probability performance; fading channel characterization; geometric-based stochastic channel modeling; linear antenna array; mobile station receiver; oscillating-beam-pattern smart antennas; symbol duration; time diversity; time varying channel; Antenna arrays; Coherence; Diversity reception; Fading; Linear antenna arrays; Mobile antennas; Phased arrays; Receiving antennas; Solid modeling; Stochastic processes;
Conference_Titel :
Vehicular Technology Conference, 2001. VTC 2001 Fall. IEEE VTS 54th
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-7005-8
DOI :
10.1109/VTC.2001.956437