Title :
An efficient interconnect capacitance extractor using a blocked equation solving technique
Author :
Liu, Hong ; Yu, Wenjian ; Wang, Zeyi
Author_Institution :
Dept. Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Abstract :
With the development of the VLSI process technology, the electrical parameters of interconnects are becoming more and more important factors dominating the circuit performance. This raises the requirement to calculate the parasitic parameters even more quickly and accurately. This paper presents a blocked equation solving technique, implemented in a two-dimensional (2D) parasitic capacitance extractor using the direct boundary element method. Numerical experiments show that the blocked equation solution is superior to the GMRES iterative solver. And for the typical interconnect structure of parallel lines with copper technology, our method consumes much less CPU time and memory, compared with the famous commercial software Raphael.
Keywords :
VLSI; boundary-elements methods; capacitance; integrated circuit design; 2D parasitic capacitance extractor; VLSI; blocked equation solving technique; circuit performance; direct boundary element method; electrical parameters; interconnect capacitance extractor; parallel copper lines; two-dimensional parasitic capacitance extractor; Boundary element methods; Circuit optimization; Conductors; Copper; Integral equations; Integrated circuit interconnections; Iterative algorithms; Laplace equations; Parasitic capacitance; Sparse matrices;
Conference_Titel :
Communications, Circuits and Systems, 2004. ICCCAS 2004. 2004 International Conference on
Print_ISBN :
0-7803-8647-7
DOI :
10.1109/ICCCAS.2004.1346413