DocumentCode
1635170
Title
A novel method for measuring dielectric surface charge density by means of Pockels effect and optical phase compensation
Author
Ping, Zhang ; Kaixi, Zhang
Author_Institution
Dept. of Phys., Hebei Univ., Baoding, China
Volume
1
fYear
1997
Firstpage
102
Abstract
A new method for measuring surface charge density by means of the Pockels effect and optical phase compensation is presented. Totally different from current measuring methods, the probe of this new measuring device is made of a Pockels crystal and the principle of the measurement is based on optical phase compensation. This probe brings much less disturbance to the surface charge density, especially, one on a conductor surface and the measurement result is easily obtained by readings of a voltmeter
Keywords
Pockels effect; charge measurement; compensation; dielectric measurement; surface charging; Pockels effect; conductor surface; dielectric surface charge density measurement; optical phase compensation; probe; voltmeter; Birefringence; Density measurement; Dielectric measurements; Equations; Optical polarization; Optical propagation; Optical refraction; Optical surface waves; Optical variables control; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location
Seoul
Print_ISBN
0-7803-2651-2
Type
conf
DOI
10.1109/ICPADM.1997.617538
Filename
617538
Link To Document