Title :
A novel method for defect location using Iddq
Author :
Burong, Xu ; Hongbing, Xu ; Ying, Deng ; Houjun, Wang
Author_Institution :
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
A novel algorithm for fault location using Iddq has been presented in this paper. A significant advantage of this method is that it can effectively locate multiple defects in a circuit. An experiment used to illuminate this algorithm is discussed in detail.
Keywords :
VLSI; electric current measurement; fault location; integrated circuit testing; IC testing; Iddq; VLSI circuits; defect location; multiple defects; Automation; Circuit faults; Circuit testing; Current measurement; Delay; Electrical fault detection; Fault detection; Fault diagnosis; Fault location; Voltage;
Conference_Titel :
Communications, Circuits and Systems, 2004. ICCCAS 2004. 2004 International Conference on
Print_ISBN :
0-7803-8647-7
DOI :
10.1109/ICCCAS.2004.1346416
