Title : 
Novel polymer resistive memory based on parylene with high compatibility and scalability
         
        
            Author : 
Tang, Yu ; Kuang, Yongbian ; Ding, Wei ; Zhang, Lijie ; Tang, Poren ; Qin, Shiqiang ; Wang, Yangyuan ; Huang, Ru
         
        
            Author_Institution : 
Inst. of Microelectron., Peking Univ., Beijing, China
         
        
        
        
        
            Abstract : 
A novel polymer (organic) resistive memory device with the structure of W/parylene+Au/Al is presented in this paper. The organic memory device exhibits not only high scalability but also good compatibility with CMOS back-end process, for parylene is immune to the lithographic solvents. Moreover, parylene film could be fabricated by chemical vapor deposition (CVD) instead of spin-coating, thus the quality and uniformity of the film can be improved. The device exhibits good nonvolatile memory characteristics, including low operating voltage (1.5 V / -3 V) and good retention capability (29000 s). A possible switching mechanism is also proposed and supported by the experimental data. The device shows great potentials for flexible, stackable and high-density memory applications.
         
        
            Keywords : 
aluminium; chemical vapour deposition; gold; polymers; random-access storage; tungsten; CMOS back-end process; CVD; chemical vapor deposition; lithographic solvent; nonvolatile memory characteristic; organic memory device; parylene; polymer resistive memory; switching mechanism; voltage 1.5 V to -3 V; Electrodes; Fabrication; Films; Gold; Nonvolatile memory; Polymers; Switches;
         
        
        
        
            Conference_Titel : 
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
         
        
            Conference_Location : 
Shanghai
         
        
            Print_ISBN : 
978-1-4244-5797-7
         
        
        
            DOI : 
10.1109/ICSICT.2010.5667590