• DocumentCode
    1635420
  • Title

    60 GHz OFDM experimental system employing decision-directed phase noise compensation

  • Author

    Suyama, Satoshi ; Hashimoto, Yuki ; Suzuki, Hiroshi ; Fukawa, Kazuhiko

  • Author_Institution
    Tokyo Inst. of Technol., Tokyo, Japan
  • fYear
    2012
  • Firstpage
    191
  • Lastpage
    194
  • Abstract
    This paper presents decision-directed phase noise compensation (DD-PNC) by digital signal processing for millimeter-wave 60 GHz OFDM systems, and verifies the effectiveness of DD-PNC by using a 60 GHz OFDM experimental system. 60 GHz frequency synthesizer implemented in single-chip RF-CMOS IC suffers from relatively large phase noise, which severely degrades performances of the OFDM transmission with multi-level QAM. In order to alleviate this impairment, this paper applies DD-PNC to the baseband (BB) demodulation processing which recursively estimates the phase noise and removes the estimate from the received signal. This paper also introduces the 60-GHz OFDM experimental system which consists of both a BB signal processing circuit including ADC and DAC and a commercial 60 GHz transceiver. Experimental results demonstrate that DD-PNC can drastically alleviate severe performance degradation of 2.96 Gbps OFDM/64QAM due to the phase noise of -80 dBc/Hz at 1 MHz offset.
  • Keywords
    CMOS integrated circuits; OFDM modulation; frequency synthesizers; phase noise; quadrature amplitude modulation; radio transceivers; recursive estimation; ADC; DAC; DD-PNC; OFDM experimental system; baseband demodulation processing; decision-directed phase noise compensation; frequency 60 GHz; frequency synthesizer; multilevel QAM; radio transceiver; recursive estimation; single-chip RF-CMOS IC; Demodulation; Field programmable gate arrays; OFDM; Phase noise; Radio transmitters; Receivers; OFDM; Wireless communication; experiment; millimeter wave; phase noise compensation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium (RWS), 2012 IEEE
  • Conference_Location
    Santa Clara, CA
  • ISSN
    2164-2958
  • Print_ISBN
    978-1-4577-1153-4
  • Type

    conf

  • DOI
    10.1109/RWS.2012.6175394
  • Filename
    6175394