Bounding attraction areas of a third-order sigma-delta modulator

Author

Zhang, J. ; Brennan, P.V. ; Smith, P.D. ; Vinogradova, E.

Author_Institution

Dept. of Electron. & Electr. Eng., Univ. Coll. London, UK

Volume

2

fYear

2004

Firstpage

1377

Abstract

The paper introduces a novel approach, using the critical planes tool and noninvertible map theory, to analyze the boundaries of attraction areas for the integrator outputs of third-order sigma-delta modulators. This allows estimation of the clipping level of the modulators and determination of the required on-chip area for switched-capacitors in the implementation of these modulators. This approach is also very flexible and may be applied to the design and implementation of a range of sigma-delta modulator architectures.

Keywords

VLSI; integrated circuit layout; integrating circuits; modulators; nonlinear network synthesis; parameter estimation; sigma-delta modulation; A/D conversion; D/A conversion; VLSI; bounding attraction areas; critical planes tool; integrator outputs; modulator clipping level estimation; noninvertible map theory; on-chip area; switched-capacitors; third-order sigma-delta modulator; Circuit noise; Data conversion; Delta modulation; Delta-sigma modulation; Digital circuits; Educational institutions; Mathematics; Noise reduction; Noise shaping; Quantization;

fLanguage

English

Publisher

ieee

Conference_Titel

Communications, Circuits and Systems, 2004. ICCCAS 2004. 2004 International Conference on

Print_ISBN

0-7803-8647-7

Type

conf

DOI

10.1109/ICCCAS.2004.1346432

Filename

1346432