DocumentCode :
1635870
Title :
Measurement of time-dependent sheath for the planar target in plasma source ion implantation
Author :
Kim, G.-W. ; Han, S.-H. ; Kim, G.-H.
Author_Institution :
Res. Center for Electron. Mater. & Components, Hanyang Univ., Ansan, South Korea
fYear :
1998
Firstpage :
216
Abstract :
Summary form only given. In plasma source ion implantaion (PSII), the target is biased by successive negative voltage pulses with an intrinsic finite rise time to implant ions from plasma to target surface, resulting in a time-dependent sheath around target. In this work, the Langmuir probe was used to study the sheath motion around a planar target with various pulse conditions and plasma conditions in PSII. It was observed that the time-dependent sheath consisted of two parts: the ion matrix sheath development and the dynamic sheath motion. A new model for the ion matrix sheath development was proposed to explain the experimental results which showed discrepancies compared with Lieberman´s model (Stewart and Lieberman, 1991) and the computer simulation. The ion matrix sheath development was in proportion to square root of pulse rise rate over plasma density and also to square root of pulse rise time. The dynamic sheaths were faster than the ion acoustic speed after the pulse rise and eventually slowed down to approximately a third of ion acoustic speed.
Keywords :
ion implantation; plasma density; plasma production; plasma sheaths; plasma simulation; Langmuir probe; dynamic sheath motion; intrinsic finite rise time; ion acoustic speed; ion matrix sheath development; planar target biassing; plasma conditions; plasma density; plasma source ion implantation; pulse conditions; pulse rise rate; pulse rise time; sheath motion; successive negative voltage pulses; time-dependent sheath; Acoustic pulses; Computer simulation; Implants; Plasma density; Plasma measurements; Plasma sheaths; Plasma sources; Probes; Transmission line matrix methods; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location :
Raleigh, NC, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-4792-7
Type :
conf
DOI :
10.1109/PLASMA.1998.677721
Filename :
677721
Link To Document :
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