Title :
Monitoring product reliability and supply chain logistics in warranty data
Author :
Overstreet, Jason ; Mahadevan, Sankaran
Abstract :
In this paper, we show how warranty data may be used to monitor the distributions of time spent by the product in the supply chain and its time to failure after reaching the consumer using simulated data. In our proposed modeling method, we estimate the parameters of the two distributions based on available warranty data that are collected periodically. Standard I-MR charts in statistical process control are used in monitoring the parameters that affect supply chain and product reliability.
Keywords :
Weibull distribution; control charts; reliability; statistical process control; supply chains; warranties; I-MR chart; Weibull distribution; product reliability monitoring; statistical process control; supply chain logistics; time distribution; warranty data; Manufacturing; Monitoring; Process control; Reliability; Supply chains; Warranties; Statistical Process Control; Supply Chain; Time-to-failure; Warranty;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2012 Proceedings - Annual
Conference_Location :
Reno, NV
Print_ISBN :
978-1-4577-1849-6
DOI :
10.1109/RAMS.2012.6175425