DocumentCode
1636169
Title
Investigations of boundary layer formation as a function of nitrogen concentration and reactor pressure during microwave plasma deposition of diamond films
Author
Ayres, V.M. ; Farhan, Mohammad ; Mossbrucker, J. ; Huang, W.S. ; Wright, B. ; Asmussen, J.
Author_Institution
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
fYear
1998
Firstpage
222
Abstract
Summary form only given. Recent studies within our group have focused on the effects of nitrogen on diamond film growth. Very small concentrations of nitrogen have been shown to enhance CVD diamond film growth, while larger concentrations may result in rough growth. In any CVD growth, within several gas phase mean free paths of the surface, the composition of the gas is perturbed by the effects of the reactions occurring at the surface. A chemical boundary layer with temperature and concentration gradients is formed, through which species diffuse to reach the surface. Boundary layer transport in CVD diamond film growth has been studied for hydrogen, carbon and oxygen species. The transport of nitrogen has been less studied. Also the transport mechanisms and growth are somewhat specific to deposition conditions. Our deposition conditions are based on use of a five inch discharge 2.45 GHz microwave plasma reactor, and transport over wide areas has also been less studied.
Keywords
boundary layers; diamond; impurities; plasma CVD; plasma impurities; 2.45 GHz; C:N; CVD diamond film growth; N transport; boundary layer formation; boundary layer transport; chemical boundary layer; composition; concentration gradients; deposition conditions; diamond films; gas phase mean free paths; impurity concentrations; microwave plasma deposition; microwave plasma reactor; nitrogen concentration; reactor pressure; rough growth; temperature gradients; wide area transport; Chemical vapor deposition; Diamond-like carbon; Hydrogen; Inductors; Nitrogen; Plasma temperature; Plasma transport processes; Rough surfaces; Surface discharges; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location
Raleigh, NC, USA
ISSN
0730-9244
Print_ISBN
0-7803-4792-7
Type
conf
DOI
10.1109/PLASMA.1998.677739
Filename
677739
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