DocumentCode :
1636173
Title :
Efficient analysis of warm standby systems using central limit theorem
Author :
Tannous, Ola ; Xing, Liudong
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts (UMass), Dartmouth, MA, USA
fYear :
2012
Firstpage :
1
Lastpage :
6
Abstract :
In a warm standby sparing system, the standby units have time-dependent failure behavior; they have different failure parameters or in general distributions before and after they are used to replace the on-line faulty units. Such time-dependent behavior makes the reliability analysis of warm standby system a challenging task. Existing approaches to analyzing the reliability of warm standby systems include Markov-based methods, simulation-based methods, and combinatorial me thods. Those approaches, however, have one or more of the following limitations: 1) requiring long computation time especially when results with high degree of accuracy are desired, 2) requiring exponential time-to-failure distribution for system components, and 3) involving difficult tasks of computing convolution of multiple integrals. In this paper, based on the central limit theorem, a computationally-efficient approximate method is proposed for the reliability analysis of warm standby systems. The proposed approach has no limitation on the time-to-failure distributions for the system components. Several case studies using different time-to-failure distributions and system sizes are performed to demonstrate the application of the proposed approach.
Keywords :
Markov processes; emergency power supply; failure analysis; probability; redundancy; Markov-based methods; central limit theorem; combinatorial methods; computationally-efficient approximation method; exponential time-to-failure distribution; on-line faulty units; reliability analysis; simulation-based methods; time-to-failure distributions; warm standby sparing system; Gaussian distribution; Logic gates; Random variables; Redundancy; Reliability theory; Weibull distribution; Weibull distribution; central limit theorem; exponential distribution; normal distribution; warm spare;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2012 Proceedings - Annual
Conference_Location :
Reno, NV
ISSN :
0149-144X
Print_ISBN :
978-1-4577-1849-6
Type :
conf
DOI :
10.1109/RAMS.2012.6175433
Filename :
6175433
Link To Document :
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