DocumentCode :
163621
Title :
Atmospheric pressure plasma processing and layer transfer technique for thin-film device fabrication on glass and plastic substrates
Author :
Higashi, Seiichiro
Author_Institution :
Grad. Sch. of Adv. Sci. of Matter, Hiroshima Univ., Higashi-Hiroshima, Japan
fYear :
2014
fDate :
18-20 May 2014
Firstpage :
1
Lastpage :
5
Abstract :
Crystalline growth from melt during micro-thermal-plasma-jet (μ-TPJ) irradiation to amorphous silicon (a-Si) film has been directly observed by high-speed camera. Long lateral growth perpendicular to the oval-shaped liquid-solid interface results in formation of random grain boundaries (GBs). Introduction of strip pattern markedly reduces random GBs and enables single-crystalline growth at predetermined channel regions. N-and p-channel thin-film transistors (TFTs) showed high performance and small characteristic variability, and operation of 8-bit shift register at a supply voltage of 5 V with the clock frequency of 50 MHz has been achieved. In addition, we propose a local layer transfer technique utilizing meniscus force of water, which enables formation of single-crystalline silicon (100) layer on glass and polyethylene terephthalate (PET) substrates. High mobility TFTs of 1226 and 609 cm2 V-1 s-1 respectively, have been successfully fabricated on each substrate.
Keywords :
amorphous semiconductors; crystal growth from melt; elemental semiconductors; glass; grain boundaries; plasma materials processing; plastics; rapid thermal annealing; semiconductor thin films; silicon; thin film transistors; μ-TPJ irradiation; PET substrates; Si; TFTs; amorphous silicon film; atmospheric pressure plasma processing; crystalline growth from melt; frequency 50 MHz; glass substrates; high-speed camera; local layer transfer technique; long lateral growth; meniscus force; microthermal-plasma-jet irradiation; n-channel thin-film transistors; oval-shaped liquid-solid interface; p-channel thin-film transistors; plastic substrates; polyethylene terephthalate substrates; predetermined channel regions; random GB reduction; random grain boundaries; shift register; single-crystalline growth; single-crystalline silicon layer; small characteristic variability; strip pattern; thermal plasma jet annealing technique; thin-film device fabrication; voltage 5 V; word length 8 bit; Films; Glass; Positron emission tomography; Silicon; Strips; Substrates; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Junction Technology (IWJT), 2014 International Workshop on
Conference_Location :
Shanghai
Type :
conf
DOI :
10.1109/IWJT.2014.6842054
Filename :
6842054
Link To Document :
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