DocumentCode :
1636317
Title :
A high isolation CMFB downconversion micromixer
Author :
Meng, C.C. ; Xu, S.K. ; Wu, T.H. ; Chao, M.H. ; Huang, G.W.
Author_Institution :
Dept. of Commun. Eng., Nat. Chiao-Tung Univ., Hsin-Chu, Taiwan
Volume :
1
fYear :
2003
Abstract :
CMOS deep N-well technology can eliminate body effects of NMOS transistors and improve LO-IF and LO-RF isolation in a Gilbert micromixer. A 37 dB LO-IF and 38 dB LO-RF isolation downconversion micromixer with 19 dB conversion gain, IP1/sub dB/ = -19.5 dBm and IIP/sub 3/ = -12.5 dBm when RF = 2.4 GHz and LO = 2.25 GHz is demonstrated in this paper by using 0.18 /spl mu/m deep N-well CMOS technology. The input return loss and output return loss are better than 15 dB for frequencies up to 6 GHz. On the other hand, a downconversion micromixer without deep n-well has almost identical power performance but achieves only 20 dB LO-IF isolation and 21 dB LO-RF isolation even if two kinds of mixers are fabricated in adjacent areas of the same wafer. The downconversion micromixer used here has intrinsically single-to-differential input stage and active differential PMOS loads to increase IF differential gain while CMFB is used to stabilize bias points. An IF differential amplifier converts differential output into a single-ended output. Finally, an off-chip rat-race coupler provides balanced LO signals to facilitate isolation measurement.
Keywords :
CMOS analogue integrated circuits; MMIC mixers; circuit feedback; field effect MMIC; losses; 0.18 micron; 19 dB; 2.4 to 6 GHz; CMFB; Gilbert micromixer; IF differential gain; LO-IF isolation; LO-RF isolation; active differential PMOS loads; common mode feedback; conversion gain; deep N-well technology; differential output; downconversion micromixer; input return loss; off-chip rat-race coupler; output return loss; power performance; single-to-differential input stage; CMOS technology; Chaotic communication; Degradation; Differential amplifiers; Frequency; Gain; Isolation technology; MOSFETs; Mixers; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7695-1
Type :
conf
DOI :
10.1109/MWSYM.2003.1211045
Filename :
1211045
Link To Document :
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