DocumentCode
163651
Title
Contents
fYear
2014
fDate
12-14 May 2014
Abstract
The following topics are dealt with: power devices and ICs; nanoelectronic devices; MEMS and sensors; device physics; reliability physics; circuit design and testing; and system design.
Keywords
circuit testing; integrated circuits; micromechanical devices; nanoelectronics; network synthesis; power semiconductor devices; reliability; sensors; ICs; MEMS; circuit design; circuit testing; device physics; nanoelectronic devices; power devices; reliability physics; sensors; system design;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location
Belgrade
Print_ISBN
978-1-4799-5295-3
Type
conf
DOI
10.1109/MIEL.2014.6842073
Filename
6842073
Link To Document