Abstract :
The following topics are dealt with: power devices and ICs; nanoelectronic devices; MEMS and sensors; device physics; reliability physics; circuit design and testing; and system design.
Keywords :
circuit testing; integrated circuits; micromechanical devices; nanoelectronics; network synthesis; power semiconductor devices; reliability; sensors; ICs; MEMS; circuit design; circuit testing; device physics; nanoelectronic devices; power devices; reliability physics; sensors; system design;
Conference_Titel :
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-5295-3
DOI :
10.1109/MIEL.2014.6842073
