DocumentCode
1636757
Title
Charging characteristics of Sb nanocrystals embedded in copper phthalocyanine films for memory applications
Author
Huang, Yue ; Ding, Shi-Jin ; Zahn, Dietrich R T
Author_Institution
Dept. of Microelectron., Fudan Univ., Shanghai, China
fYear
2010
Firstpage
1289
Lastpage
1291
Abstract
The charging characteristics of Sb nanocrystals embedded in organic semiconductor copper phthalocyanine (CuPc) have been studied for the first time. The images from atomic force microscopy show that Sb NCs grown on the surface of CuPc film exhibit a vertical height of 10-15 nm and uniform distribution, which are interspersed with a few bigger ones (~30 nm). Two kinds of capacitance-voltage measurements, frequency responds and hysteresis loops, of the control sample and the one embedded with Sb NCs indicate the charging and discharging of the Sb NCs.
Keywords
antimony; atomic force microscopy; capacitance measurement; organic semiconductors; semiconductor storage; voltage measurement; Sb; atomic force microscopy; capacitance-voltage measurement; charging characteristics; frequency response; hysteresis loop; memory application; nanocrystals; organic semiconductor copper phthalocyanine film; Capacitance-voltage characteristics; Films; Frequency measurement; Hysteresis; Metals; Nanocrystals; Organic materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-5797-7
Type
conf
DOI
10.1109/ICSICT.2010.5667640
Filename
5667640
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