• DocumentCode
    1636757
  • Title

    Charging characteristics of Sb nanocrystals embedded in copper phthalocyanine films for memory applications

  • Author

    Huang, Yue ; Ding, Shi-Jin ; Zahn, Dietrich R T

  • Author_Institution
    Dept. of Microelectron., Fudan Univ., Shanghai, China
  • fYear
    2010
  • Firstpage
    1289
  • Lastpage
    1291
  • Abstract
    The charging characteristics of Sb nanocrystals embedded in organic semiconductor copper phthalocyanine (CuPc) have been studied for the first time. The images from atomic force microscopy show that Sb NCs grown on the surface of CuPc film exhibit a vertical height of 10-15 nm and uniform distribution, which are interspersed with a few bigger ones (~30 nm). Two kinds of capacitance-voltage measurements, frequency responds and hysteresis loops, of the control sample and the one embedded with Sb NCs indicate the charging and discharging of the Sb NCs.
  • Keywords
    antimony; atomic force microscopy; capacitance measurement; organic semiconductors; semiconductor storage; voltage measurement; Sb; atomic force microscopy; capacitance-voltage measurement; charging characteristics; frequency response; hysteresis loop; memory application; nanocrystals; organic semiconductor copper phthalocyanine film; Capacitance-voltage characteristics; Films; Frequency measurement; Hysteresis; Metals; Nanocrystals; Organic materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-5797-7
  • Type

    conf

  • DOI
    10.1109/ICSICT.2010.5667640
  • Filename
    5667640