Title :
Mathematical models of electronic devices reliability
Author_Institution :
Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
The mathematical models of reliability of electronic devices are classified.
Keywords :
semiconductor device models; semiconductor device reliability; electronic devices reliability; mathematical models; bathtub curve; drift models; reliability;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2008 Proceedings of International Conference on
Conference_Location :
Lviv-Slavsko
Print_ISBN :
978-966-553-678-9
