DocumentCode
1637091
Title
Mathematical models of electronic devices reliability
Author
Lazko, Oxana
Author_Institution
Lviv Polytech. Nat. Univ., Lviv, Ukraine
fYear
2008
Firstpage
527
Lastpage
527
Abstract
The mathematical models of reliability of electronic devices are classified.
Keywords
semiconductor device models; semiconductor device reliability; electronic devices reliability; mathematical models; bathtub curve; drift models; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2008 Proceedings of International Conference on
Conference_Location
Lviv-Slavsko
Print_ISBN
978-966-553-678-9
Type
conf
Filename
5423424
Link To Document