• DocumentCode
    1637277
  • Title

    Power supply ESS: A case study evaluating IPC 9592A recommendations

  • Author

    Doertenbach, Neill

  • Author_Institution
    Qualmark Corp., Denver, CO, USA
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In 2010, IPC released 9592A, “Performance Parameters for Power Conversion Devices”. The standard includes descriptions of Highly Accelerated Stress Screening (HASS) and Highly Accelerated Stress Audits (HASA) for PCD (Power Conversion Device) ESS, and describes them as more effective than Burn-In. A case study comparing the effectiveness of Burn In with Highly Accelerated Stress Audits (HASA) has demonstrated the greater effectiveness of HASA. Implemented at a high volume PCD manufacturer for a one year period, the study determined that HASA, run after a tradition Burn-In process, caught failures that the Burn-In process was unable to discover. Failure rates of PCDs in Burn-In were 0.002% of the units, whereas failures in HASA were 1.25% of the units tested. Further, field warranty failures for units run through HA SA were non-existent whereas warranty failure rates of PCDs run only through Burn-In were 0.15%, a material economic difference in such high volume PCDs. The paper concludes that the IPC 9592A recommendations for using HASS and HASA in PCD manufacturing are well-founded, and that they are demonstrably superior to Burn-In for reducing field failure rates.
  • Keywords
    failure analysis; power conversion; power supply quality; standards; IPC 9592A recommendations; PCD manufacturer; burn-in process; field warranty failures; highly accelerated stress audits; highly accelerated stress screening; material economic difference; performance parameters; power conversion devices; power supply ESS; standard; warranty failure rates; Industries; Life estimation; Power conversion; Production; Standards; Stress; Testing; Burn-In; ESS; HASA; HASS; Highly Accelerated Life Test; Highly Accelerated Stress Audit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2012 Proceedings - Annual
  • Conference_Location
    Reno, NV
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4577-1849-6
  • Type

    conf

  • DOI
    10.1109/RAMS.2012.6175473
  • Filename
    6175473