DocumentCode :
163733
Title :
Infrared focal plane array FPA320×256 radiation hardness investigation
Author :
Cherniak, Maksim E. ; Ulanova, Anastasia V. ; Nikiforov, Alexander Y.
Author_Institution :
Nat. Res. Nucl. Univ. “MEPHI”, Moscow, Russia
fYear :
2014
fDate :
12-14 May 2014
Firstpage :
195
Lastpage :
198
Abstract :
Paper discusses influence of proton- and gamma-irradiation on operation of Infrared Focal Plane Array FPA320×256. IR FPA output signal degradation of each pixel vs integration time dependance with uniform illumination (after proton irradiation) and without illumination (after proton as well as gamma irradiation) was considered.
Keywords :
focal planes; gamma-ray effects; proton effects; radiation hardening (electronics); IR FPA output signal degradation; gamma-irradiation; infrared focal plane array; integration time dependance; proton-irradiation; radiation hardness investigation; uniform illumination; Arrays; CMOS integrated circuits; Current measurement; Lighting; Protons; Radiation effects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-5295-3
Type :
conf
DOI :
10.1109/MIEL.2014.6842119
Filename :
6842119
Link To Document :
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