Title :
Design Test: a solution to the problems of ASIC verification
Author :
Allingham, Don ; Bashford, Pat ; Peters, Mike ; Vendl, Dean
Author_Institution :
NCR Microelectron., Fort Collins, CO, USA
Abstract :
Assuming that adequate logic simulation and automatic test equipment are available, the authors note that there remain three major roadblocks associated with ASIC (application-specific integrated circuit) verification: efficiently generating logic simulations that thoroughly exercise the design; automatically and accurately verifying that the simulation results match the designer´s expectations; and automatically and accurately producing test vectors for ATE (automatic test equipment) which match the logic simulations. The authors describe Design Test, a technique that overcomes each of these roadblocks through a unique automated method of linking design and test using a software system approach. Design Test´s use of embedded tester knowledge early in the design process is a key factor in its capabilities. Not only does Design Test greatly increase the efficiency of ASIC verification, but it provides the means of increasing the thoroughness and accuracy of the verification activities as well
Keywords :
application specific integrated circuits; automatic test equipment; automatic testing; electronic engineering computing; integrated logic circuits; logic CAD; logic testing; ASIC verification; ATE; application-specific integrated circuit; automatic test equipment; embedded tester knowledge; logic CAD; logic simulation; test vectors; Application specific integrated circuits; Automatic logic units; Automatic test equipment; Automatic testing; Circuit simulation; Circuit testing; Logic circuits; Logic design; Logic testing; Software testing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82380