Title :
Thermodynamic model for process of expense resource electronic devices
Author :
Nevlyudova, Victoria
Author_Institution :
Trainee-Contributor of Syst. Engineeringchief (SE) Fac., Kharkov Nat. Univ. of Radio Electron. (KHURE), Kharkov, Ukraine
Abstract :
There is described a vital cycle model electronic devices that based on thermodynamic method of approach to describing degradation processes which limit period of normal functioning of devices in this article. Vital cycle model reflects electronic devices existence during the time from their creation and changing its quality during of running.
Keywords :
ageing; semiconductor device models; semiconductor device reliability; thermal analysis; thermodynamics; expense resource electronic devices; thermodynamic model; vital cycle model electronic device; Electronic devices; model of evolution process; resource of electronic equipment; thermodynamic approach; vital cycle;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2008 Proceedings of International Conference on
Conference_Location :
Lviv-Slavsko
Print_ISBN :
978-966-553-678-9
