• DocumentCode
    1637485
  • Title

    Experimental study on damage analysis of sliding contact surface by using shadow image processing technique

  • Author

    Kanazawa, Miyataka ; Iyoda, Masanori ; Taniguchi, Masanari ; Akasaki, Isamu ; Takagi, Toshiyuki

  • Author_Institution
    Fac. of Sci. & Technol., Meijo Univ., Nagoya, Japan
  • Volume
    1
  • fYear
    1997
  • Firstpage
    418
  • Abstract
    The quantitative observation of contact surface is one of the most important subjects for the analysis of contact phenomena, because the surface damage of the electrical sliding contact is a main cause of failure in the sliding contact. In this study, in order to make clear the relationship between the contact phenomena and the damage of contact surface, a digital image measuring system (DIMS) was developed, and for quantitative analysis of the damage on the surface, the shadow image processing technique (SIFT) was applied. By using both DIMS and SIFT, the damage on the contact surface could be successfully observed as a 3-D graphic image, and the relationship between the electrical contact resistance and the damage on the sliding contact surface was discussed
  • Keywords
    contact resistance; electrical contacts; image processing; 3D graphic image; DIMS; SIFT; contact phenomena; contact resistance; damage analysis; digital image measuring system; electrical sliding contact; shadow image processing technique; sliding contact surface; Brightness; Chemical analysis; Contacts; Digital images; Electric variables measurement; Graphics; Image analysis; Image processing; Surface resistance; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
  • Conference_Location
    Ottawa, Ont.
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-3747-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1997.603984
  • Filename
    603984