DocumentCode
1637485
Title
Experimental study on damage analysis of sliding contact surface by using shadow image processing technique
Author
Kanazawa, Miyataka ; Iyoda, Masanori ; Taniguchi, Masanari ; Akasaki, Isamu ; Takagi, Toshiyuki
Author_Institution
Fac. of Sci. & Technol., Meijo Univ., Nagoya, Japan
Volume
1
fYear
1997
Firstpage
418
Abstract
The quantitative observation of contact surface is one of the most important subjects for the analysis of contact phenomena, because the surface damage of the electrical sliding contact is a main cause of failure in the sliding contact. In this study, in order to make clear the relationship between the contact phenomena and the damage of contact surface, a digital image measuring system (DIMS) was developed, and for quantitative analysis of the damage on the surface, the shadow image processing technique (SIFT) was applied. By using both DIMS and SIFT, the damage on the contact surface could be successfully observed as a 3-D graphic image, and the relationship between the electrical contact resistance and the damage on the sliding contact surface was discussed
Keywords
contact resistance; electrical contacts; image processing; 3D graphic image; DIMS; SIFT; contact phenomena; contact resistance; damage analysis; digital image measuring system; electrical sliding contact; shadow image processing technique; sliding contact surface; Brightness; Chemical analysis; Contacts; Digital images; Electric variables measurement; Graphics; Image analysis; Image processing; Surface resistance; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location
Ottawa, Ont.
ISSN
1091-5281
Print_ISBN
0-7803-3747-6
Type
conf
DOI
10.1109/IMTC.1997.603984
Filename
603984
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