DocumentCode :
1637562
Title :
Random field modeling with insufficient data sets for probability analysis
Author :
Xi, Zhimin ; Jung, Byung C. ; Youn, Byeng D.
Author_Institution :
Univ. of Michigan-Dearborn, Dearborn, MI, USA
fYear :
2012
Firstpage :
1
Lastpage :
5
Abstract :
It has been widely acknowledged that consideration of the random field is quite significant to accurately predict variability in system performances. However, current approaches for characterizing the random field can only be applied to the situation with sufficient random field data sets and are not suitable to most engineering problems where the data sets are insufficient. The contribution of this paper is to mo del the random field based on the insufficient data sets such that sufficient data sets can be simulated or generated according to the random field modeling. Therefore, available random field characterization approaches and probability analysis methods can be used for probability analysis and design of many engineering problems with the lack of random field data sets. The proposed random field modeling is composed of two technical components including: 1) a Bayesian updating approach using the Markov Chain Monte Carlo (MCMC) method for modeling the random field based on available random field data sets; and 2) a Bayesian Copula dependence modeling approach for modeling statistical dependence of random field realizations at different measurement locations. A refrigerator assembly example is used to demonstrate the effectiveness of the proposed approach.
Keywords :
Bayes methods; Markov processes; Monte Carlo methods; assembling; random processes; refrigerators; reliability; statistical analysis; Bayesian Copula dependence modeling; Bayesian updating approach; Markov Chain Monte Carlo method; engineering problem; insufficient data set; probability analysis; random field characterization; random field data set; random field modeling; refrigerator assembly; reliability analysis; statistical dependence modeling; system performance variability prediction; Assembly; Bayesian methods; Data models; Deformable models; Fasteners; Refrigerators; Vectors; Bayesian Copula; Bayesian updating; insufficient data sets; probability analysis; random field;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2012 Proceedings - Annual
Conference_Location :
Reno, NV
ISSN :
0149-144X
Print_ISBN :
978-1-4577-1849-6
Type :
conf
DOI :
10.1109/RAMS.2012.6175482
Filename :
6175482
Link To Document :
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