Title :
Dynamic power-supply and well noise measurement and analysis for high frequency body-biased circuits
Author :
Shimazaki, Kenji ; Nagata, Makoto ; Okumoto, Takeshi ; Hirano, Shoji ; Tsujikawa, Hiroyuki
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Kyoto, Japan
Abstract :
Dynamic noises on power-supply as well as multiple wells necessary for body-biased circuits show frequency components strongly characterized by the interaction of circuit operation and AC transfer of biasing networks. Measurements with the resolution of 100-ps and 100-uV for a few 100-ns and 1-V ranges on multiple points in a product register file are performed at various operating frequencies up to 400 MHz and show the noises clearly emphasized in frequency domain by the interaction. A proposed analysis flow recruiting a fast SPICE simulator and parasitic extractors can predict the dynamic noises due to combined power supply, ground, well, and substrate interactions, and provide robustness to the design of body-bias control circuitry.
Keywords :
CMOS integrated circuits; SPICE; VLSI; integrated circuit design; integrated circuit noise; power supply circuits; 100 ns; 100 ps; 400 MHz; AC transfer; biasing networks; body-bias control circuitry; body-biased circuits; circuit operation; dynamic power-supply; fast SPICE simulator; frequency components; frequency domain; high frequency body-biased circuits; parasitic extractors; product register file; well noise measurement; Analytical models; Circuit noise; Frequency domain analysis; Frequency measurement; Noise measurement; Performance evaluation; Predictive models; Recruitment; Registers; SPICE;
Conference_Titel :
VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on
Print_ISBN :
0-7803-8287-0
DOI :
10.1109/VLSIC.2004.1346516
