Sasaki, K. ; Hanamura, S. ; Ueda, K. ; Oono, T. ; Minato, O. ; Nishimura, K. ; Sakai, Y. ; Meguro, S. ; Tsunematsu, M. ; Masuhara, T. ; Kubotera, M. ; Toyoshima, H.
Author_Institution :
Hitachi Ltd., Tokyo, Japan
fYear :
1988
Firstpage :
174
Keywords :
CMOS process; CMOS technology; Decoding; Gain control; MOS devices; Packaging; Random access memory; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
