DocumentCode :
1637641
Title :
Power supply di/dt measurement using on-chip di/dt detector circuit
Author :
Nakura, Tom ; Ikeda, Makoto ; Asada, Kunihiro
Author_Institution :
Dept. of Electron. Eng., Tokyo Univ., Japan
fYear :
2004
Firstpage :
106
Lastpage :
109
Abstract :
This paper demonstrates an on-chip di/dt detector circuit. The di/dt detector circuit consists of a spiral inductor under the power supply line which induces a di/dt proportional voltage, and an amplifier which amplifies and outputs the value. The measurement results show that the di/dt detector output and the voltage difference between a resistor have good agreement. The di/dt detector also measures the de-coupling capacitor effects for the di/dt reduction.
Keywords :
CMOS integrated circuits; integrated circuit noise; integrated circuit testing; power supply circuits; de-coupling capacitor; on-chip di/dt detector circuit; power supply di/dt measurement; power supply line; spiral inductor; Capacitors; Circuits; Detectors; Inductors; Power amplifiers; Power measurement; Power supplies; Resistors; Spirals; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on
Print_ISBN :
0-7803-8287-0
Type :
conf
DOI :
10.1109/VLSIC.2004.1346519
Filename :
1346519
Link To Document :
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