Title :
Dielectric powders X-ray crystallography using rietveld refinement
Author_Institution :
Dept. of Electron. Devices & Circuits, Politeh. Univ. of Bucharest, Bucharest, Romania
Abstract :
This paper presents an accurate method to determine the atomic and molecular structure of crystal nanomaterials based on X-ray crystallography. Rietveld refinement using EXPO2009 Software has been applied to improve the results. Six different powder samples have been studied.
Keywords :
X-ray crystallography; X-ray diffraction; dielectric materials; materials science computing; nanostructured materials; powders; EXPO2009 software; Rietveld refinement; X-ray crystallography; atomic structure; crystal nanomaterials; dielectric powders; molecular structure; Dielectrics; Diffraction; Lattices; Materials; Powders; X-ray diffraction; X-ray scattering;
Conference_Titel :
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-5295-3
DOI :
10.1109/MIEL.2014.6842134
