DocumentCode
163770
Title
Low temperature of formation of nickel germanide on crystalline germanium
Author
Algahtani, Fahid ; Blackford, Mark ; Alnassar, Mohammad Saleh N. ; Reeves, Geoffrey K. ; Leech, Patrick ; Pirogova, Elena ; Holland, Anthony S.
Author_Institution
Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
fYear
2014
fDate
12-14 May 2014
Firstpage
253
Lastpage
256
Abstract
Thin films of nickel germanide conveniently form at the relatively low temperature of 300C in a matter of minutes and at even lower temperatures over a longer time. Here we report on the formation of NiGe on crystalline germanium substrates at low temperatures (less than 300C). Ni films deposited on Ge substrates formed NiGe by heating the samples in an atmosphere nearly void of oxygen. Ni films of thickness 50 to 400nm were deposited on crystalline germanium and heat treatments undertaken on samples for time durations at different temperatures of 5 minutes to 12 hours. It was found that the thickness was not a significant factor and that NiGe formed in a few minutes for all thicknesses heated at 300 C. Long durations were required for the lowest temperature of formation.
Keywords
heat treatment; low-temperature techniques; nickel compounds; substrates; thin films; NiGe; crystalline germanium substrates; heat treatments; nickel germanide; size 50 nm to 400 nm; temperature 300 degC; thin films; time 5 min to 12 hour; Films; Germanium; Heat treatment; Nickel; Probes; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location
Belgrade
Print_ISBN
978-1-4799-5295-3
Type
conf
DOI
10.1109/MIEL.2014.6842135
Filename
6842135
Link To Document