• DocumentCode
    163770
  • Title

    Low temperature of formation of nickel germanide on crystalline germanium

  • Author

    Algahtani, Fahid ; Blackford, Mark ; Alnassar, Mohammad Saleh N. ; Reeves, Geoffrey K. ; Leech, Patrick ; Pirogova, Elena ; Holland, Anthony S.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
  • fYear
    2014
  • fDate
    12-14 May 2014
  • Firstpage
    253
  • Lastpage
    256
  • Abstract
    Thin films of nickel germanide conveniently form at the relatively low temperature of 300C in a matter of minutes and at even lower temperatures over a longer time. Here we report on the formation of NiGe on crystalline germanium substrates at low temperatures (less than 300C). Ni films deposited on Ge substrates formed NiGe by heating the samples in an atmosphere nearly void of oxygen. Ni films of thickness 50 to 400nm were deposited on crystalline germanium and heat treatments undertaken on samples for time durations at different temperatures of 5 minutes to 12 hours. It was found that the thickness was not a significant factor and that NiGe formed in a few minutes for all thicknesses heated at 300 C. Long durations were required for the lowest temperature of formation.
  • Keywords
    heat treatment; low-temperature techniques; nickel compounds; substrates; thin films; NiGe; crystalline germanium substrates; heat treatments; nickel germanide; size 50 nm to 400 nm; temperature 300 degC; thin films; time 5 min to 12 hour; Films; Germanium; Heat treatment; Nickel; Probes; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
  • Conference_Location
    Belgrade
  • Print_ISBN
    978-1-4799-5295-3
  • Type

    conf

  • DOI
    10.1109/MIEL.2014.6842135
  • Filename
    6842135