Title :
Low temperature of formation of nickel germanide on crystalline germanium
Author :
Algahtani, Fahid ; Blackford, Mark ; Alnassar, Mohammad Saleh N. ; Reeves, Geoffrey K. ; Leech, Patrick ; Pirogova, Elena ; Holland, Anthony S.
Author_Institution :
Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
Abstract :
Thin films of nickel germanide conveniently form at the relatively low temperature of 300C in a matter of minutes and at even lower temperatures over a longer time. Here we report on the formation of NiGe on crystalline germanium substrates at low temperatures (less than 300C). Ni films deposited on Ge substrates formed NiGe by heating the samples in an atmosphere nearly void of oxygen. Ni films of thickness 50 to 400nm were deposited on crystalline germanium and heat treatments undertaken on samples for time durations at different temperatures of 5 minutes to 12 hours. It was found that the thickness was not a significant factor and that NiGe formed in a few minutes for all thicknesses heated at 300 C. Long durations were required for the lowest temperature of formation.
Keywords :
heat treatment; low-temperature techniques; nickel compounds; substrates; thin films; NiGe; crystalline germanium substrates; heat treatments; nickel germanide; size 50 nm to 400 nm; temperature 300 degC; thin films; time 5 min to 12 hour; Films; Germanium; Heat treatment; Nickel; Probes; Substrates; Temperature;
Conference_Titel :
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-5295-3
DOI :
10.1109/MIEL.2014.6842135