Title :
Electron swarm parameter in SF6+Ar mixture gas
Author :
Lim, Sang-Won ; Seo, Sang-Hymn ; You, HeofYoung ; Kim, Sang-Nam ; Ha, Sung-Chul
Author_Institution :
Dongguk Univ., Seoul, South Korea
Abstract :
The electron swarm parameters in the 0.5% and 0.2% SF6-Ar mixtures are calculated by Monte Carlo simulation over the E/N(Td) range from 30 to 300 (Td) and by a backward-prolongation of the Boltzmann equation considering the latest cross section. The result two-term approximation of the Boltzmann equation analysis shows that the values of electron parameters such as the ionization, attachment, effective ionization coefficients and the electron drift velocity. The measurements are carried out by the double shutter drift tube. Electron swarm parameters in pure Ar gas and SF6-Ar mixtures are analyzed and compared by the electron Arrival Time Spectra (ATS) of Time Of Flight (TOF) method
Keywords :
Boltzmann equation; Monte Carlo methods; SF6 insulation; argon; electrical conductivity; electron attachment; electron impact ionisation; gas mixtures; ionisation; time of flight spectra; Ar; Boltzmann equation; Monte Carlo simulation; SF6; SF6+Ar mixture gas; attachment coefficient; cross section; double shutter drift tube; electron arrival time spectrum; electron drift velocity; electron swarm; ionization coefficient; time of flight method; two-term approximation; Aerospace simulation; Argon; Computational modeling; Computer simulation; Distributed computing; Electron emission; Electron mobility; Flowcharts; Monte Carlo methods; Sampling methods;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
DOI :
10.1109/ICPADM.1997.617549
