• DocumentCode
    1637813
  • Title

    An adaptive symbol mapping for BICM-ID

  • Author

    Weiwei, Fang ; Jianping, Li ; Chaoshi, Cai ; Qiong, Zhang

  • Author_Institution
    Sch. of Inf. Eng., Commun. Univ. of China, Beijing, China
  • fYear
    2010
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    Bit-interleaved coded modulation with iterative decoding (BICM-ID), which possesses low complexity, strong agility, high spectrum efficiency and excellent BER performance, has been a key technique for next generation of wireless communication. Symbol mapping, defined by the signal constellation and the bit labeling is the crucial design parameter to achieve a high coding gain for BICM-ID. In almost all the existing work, a particular symbol mapping is employed in all the region of SNR. However, there is no a single mapping scheme can always obtain better performance over all the SNRs, because at low SNRs the concentrations of symbol subset affect the performance of BICM-ID more while diversity influence more at high SNRs. CE-8PSK mapping is an outstanding symbol mapping for BICM-ID, with defect-zone existence as well. To achieve an improved performance, CE-8PSK is replaced by Gray or Mixed mapping in defect-zone. Simulation results show that by using the proposed adaptive scheme, a better performance gains up to 1 dB can be achieved for the blind-zone.
  • Keywords
    error statistics; iterative decoding; modulation coding; phase shift keying; radiocommunication; BER performance; BICM-ID; CE-8PSK mapping; adaptive symbol mapping; bit labeling; bit-interleaved coded modulation-iterative decoding; gray mapping; mixed mapping; next generation wireless communication; signal constellation; Constellation diagram; Euclidean distance; Interleaved codes; Iterative decoding; Labeling; Performance gain; Bit-interleaved coded modulation with iterative decoding; CE-8PSK; adaptive symbol mapping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering and Service Sciences (ICSESS), 2010 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-6054-0
  • Type

    conf

  • DOI
    10.1109/ICSESS.2010.5552396
  • Filename
    5552396