Title :
Application of IRT NDT for ensuring heat robustness of LED modules
Author :
Andonova, Anna ; Angelov, George ; Georgiev, Yavor ; Takov, T.
Author_Institution :
Dept. of Microelectron., Tech. Univ. of Sofia, Sofia, Bulgaria
Abstract :
The reliable operation of LED modules is toughly dependent on structural and technology solutions as well as on numerous natural and operational phenomena that impede thermal control. In the paper, various applications of InfraRed Thermography (IRT) for ensuring thermal robustness of LED modules are examined. Experimental data from IRT measurements of LED modules at different stages of pre-service quality to in-service degradation of LED modules or structure under operating conditions are presented and analyzed.
Keywords :
infrared imaging; light emitting diodes; nondestructive testing; IRT NDT; LED modules; heat robustness; infrared thermography; thermal control; thermal robustness; Degradation; Heating; Light emitting diodes; Robustness; Temperature measurement; Testing;
Conference_Titel :
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-5295-3
DOI :
10.1109/MIEL.2014.6842149
